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2006 IEEE Workshop on Signal Propagation on Interconnects (2006)
Berlin
May 9, 2006 to May 12, 2006
ISBN: 1-4244-0454-1
TABLE OF CONTENTS

Passive Rational Function Fitting of a Driving-Point Impedance from Its Real Part (Abstract)

Anne Woo , Center for Computational Electromagnetics, Electromagnetics Laboratory, ECE Department, University of Illinois at Urbana-Champaign, Urbana, IL 61801, U.S.A. Phone: 217.333.6037; Fax: 217.333.5962; E-mail: annewoo@uiuc.edu
Andreas C. Cangellaris , Center for Computational Electromagnetics, Electromagnetics Laboratory, ECE Department, University of Illinois at Urbana-Champaign, Urbana, IL 61801, U.S.A. Phone: 217.333.6037; Fax: 217.333.5962; E-mail: cangella@uiuc.edu
pp. 21-22

Uncertainties in Coplanar Waveguide Capacitance Measurements (Abstract)

Uwe Arz , Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany, E-mail: Uwe.Arz@PTB.de Phone :++49-531-762-2297
Jens Leinhos , Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany
Dirk Schubert , Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany
pp. 165-167

Dispersion Effects from Induced Dipoles (Abstract)

Paul G. Huray , University of South Carolina, Department of Electrical Engineering, 3A18 Swearingen Engineering Bldg., Columbia, SC 29208, huray@sc.edu
Steven G. Pytel , University of South Carolina, Department of Electrical Engineering, 3A18 Swearingen Engineering Bldg., Columbia, SC 29208; Intel Corporation, Center Pointe II, Suite 200, Columbia, SC 29210
Richard I. Mellitz , Intel Corporation, Center Pointe II, Suite 200, Columbia, SC 29210
Stephen H. Hall , Intel Corporation, 2111 N.E. 25th Ave, M/S JF2-86, Hillsboro, OR 97124
pp. 213-216

A Programmable Voltage Reference Dsign (Abstract)

R. Ouchen , Advanced Electronics Laboratory, Department of Electronics, Faculty of Engineering, University of Batna, Algeria
A. Hamouda , Advanced Electronics Laboratory, Department of Electronics, Faculty of Engineering, University of Batna, Algeria
A. Wiener , Institute of Computer Engineering and Microelectronics, Technical University of Berlin, Germany
R. Arnold , Institute of Computer Engineering and Microelectronics, Technical University of Berlin, Germany
N. Bouguechal , Advanced Electronics Laboratory, Department of Electronics, Faculty of Engineering, University of Batna, Algeria
O. Manck , Institute of Computer Engineering and Microelectronics, Technical University of Berlin, Germany
pp. 257-261

Estimating the First Voltage Drop for ICs with leakage (Abstract)

Thomas Strach , IBM Deutschland Entwicklung GmbH, Schönaicher Str. 220, 71032 Böblingen, strach@de.ibm.com
Stefan Uhlich , IBM Deutschland Entwicklung GmbH, Schönaicher Str. 220, 71032 Böblingen, stefan.uhlich@web.de
pp. 267-270

Considerations for Transmission Line Design on MCMs using AC Coupled Interconnect with Buried Solder Bumps (Abstract)

J.M. Wilson , North Carolina State University, Dept. of Electrical and Computer Engineering, Box 7911, Raleigh, NC 27695, jmwilson@ncsu.edu
S. E. Mick , North Carolina State University, Dept. of Electrical and Computer Engineering, Box 7911, Raleigh, NC 27695, semick@ncsu.edu
J. Xu , North Carolina State University, Dept. of Electrical and Computer Engineering, Box 7911, Raleigh, NC 27695, jxu6@ncsu.edu
L. Luo , North Carolina State University, Dept. of Electrical and Computer Engineering, Box 7911, Raleigh, NC 27695, lluo3@ncsu.edu
E. L. Erickson , North Carolina State University, Dept. of Electrical and Computer Engineering, Box 7911, Raleigh, NC 27695, elericks@ncsu.edu
P.D. Franzon , North Carolina State University, Dept. of Electrical and Computer Engineering, Box 7911, Raleigh, NC 27695, paulf@ncsu.edu
pp. 281-282
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