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Memory Technology, Design and Testin, IEEE International Workshop on (1998)
San Jose, California
Aug. 24, 1998 to Aug. 25, 1998
ISSN: 1087-4852
ISBN: 0-8186-8494-1

Welcome Message (PDF)

pp. vii
Session 1: Embedded Memory Design Aids
Session 2: Embedded DRAM

Merged Dram-Logic In The Year 2001 (Abstract)

P.W. Diodato , LUCENT Corporation
Y-H. Wong , LUCENT Corporation
C-T Liu , LUCENT Corporation
K-H. Lee , LUCENT Corporation
R. Dail , LUCENT Corporation
W.S. Lindenberger , LUCENT Corporation
A.C.. Dumbri , LUCENT Corporation
M.V. Depaolis , LUCENT Corporation
J.T. Clemens , LUCENT Corporation
W.W. Troutman , LUCENT Corporation
K. Noda , NEC Corporation
J.M. Drynan , NEC Corporation
M. Nakamae , NEC Corporation
pp. 24

BIST for Embedded Word-Oriented DRAM (Abstract)

L. Zakrevski , Boston University
M. Karpovsky , Boston University
S.H. Yang , Boston University
pp. 31
Session 3: Algorithms and Testing Techniques

Test Algorithm for Memory Cell Disturb Failures (Abstract)

D. Aadsen , Lucent Technologies, Bell Labs
L. Fenstermaker , Lucent Technologies, Bell Labs
F. Higgins , Lucent Technologies, Bell Labs
I. Kim , Lucent Technologies, Bell Labs
J. Lewandowski , Lucent Technologies, Bell Labs
J. Nagy , Lucent Technologies, Bell Labs
pp. 53

SRAM Test Using On-Chip Dynamic Power Supply Current Sensor (Abstract)

Jian Liu , Fujitsu Microelectronics, Inc.
Rafic Z. Makki , University of North Carolina at Charlotte
pp. 57
Tutorial: DRAM Fault Modeling
Tutorial: SRAM Characterization and Test
Session 4: CAM Testing

Verification of CAM Tests for Input Stuck-at Faults (Abstract)

Piotr R. Sidorowicz , University of Waterloo
Janusz A. Brzozowski , University of Waterloo
pp. 76
Session 5: Unique Fault Models

Fault Models and Test Strategies for a Two-Bit per Cell DRAM (Abstract)

Michael Redeker , University of Alberta
Bruce F. Cockburn , University of Alberta
Duncan G. Elliott , University of Alberta
pp. 84

Flip-Flop Hardening for Space Applications (Abstract)

T. Monnier , Universit? Montpellier II / CNRS
F.M. Roche , Universit? Montpellier II / CNRS
G. Cathébras , Universit? Montpellier II / CNRS
pp. 104
Session 6: Memory Repair

An Improved Analytical Yield Evaluation Method for Redundant RAM's (Abstract)

Gianluca Battaglini , University of Rome La Sapienza
Bruno Ciciani , University of Rome La Sapienza
pp. 117

Author Index (PDF)

pp. 131
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