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FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing (1993)
Toulouse, France
June 22, 1993 to June 24, 1993
ISSN: 0731-3071
ISBN: 0-8186-3680-7
TABLE OF CONTENTS

Application transparent fault management in fault tolerant Mach (PDF)

M. Russinovich , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 10-19

Faults, symptoms, and software fault tolerance in the Tandem GUARDIAN90 operating system (PDF)

I. Lee , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 20-29

Increasing system availability through on-line software version change (PDF)

D. Gupta , Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kanpur, India
pp. 30-35

Interval availability distribution computation (PDF)

G. Rubino , IRISA-INRIA, Rennes, France
pp. 48-55

Characterizing a lumping heuristic for a Markov network reliability model (PDF)

M. Balakrishnan , Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
pp. 56-65

A class of error locating codes for byte-organized memory systems (PDF)

E. Fujiwara , Dept. of Comput. Sci., Tokyo Inst. of Technol., Japan
pp. 110-119

Unidirectional error control codes (PDF)

N.H. Vaidya , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 120-129

A proposal for error-tolerating codes (PDF)

T. Matsubara , Dept. of Comput. Sci., Nat. Defense Acad., Yokosuka, Japan
pp. 130-136

Progressive retry for software error recovery in distributed systems (PDF)

Y.-M. Wang , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 138-144

Nonblocking and orphan-free message logging protocols (PDF)

L. Alvisi , Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA
pp. 145-154

Relaxing consistency in recoverable distributed shared memory (PDF)

B. Janssens , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 155-163

EXOP (Extended Operation): A new logical fault model for digital circuits (PDF)

I. Pomeranz , Electr. & Comput. Eng. Dept., Iowa Univ., Iowa City, IA, USA
pp. 166-175

Efficient testing of tree circuits (PDF)

R.S. Blanton , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 176-185

A BDD-based algorithm for computation of exact fault detection probabilities (PDF)

R. Krieger , Dept. of Comput. Sci., J.W. Goethe Univ., Frankfurt, Germany
pp. 186-195

Detection and discrimination of injected network faults (PDF)

R.A. Maxion , Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 198-207

Software fault injection and its application in distributed systems (PDF)

H.A. Rosenberg , Dept. of Elects. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 208-217

Simulation of software behavior under hardware faults (PDF)

K.K. Goswami , Center for Reliable & High-Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 218-227

Fault-tolerant wormhole routing in meshes (PDF)

C.J. Glass , Upjohn Lab., Kalamazoo, MI, USA
pp. 240-249

Designing concurrent checking sorting networks (PDF)

K. Kantawala , Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
pp. 250-259

Design of neural networks to tolerate the mixture of two types of faults (PDF)

Y. Tohma , Dept. of Comput. Sci., Tokyo Inst. of Technol., Japan
pp. 268-277

Optimum Kalman detector/corrector for fault-tolerant linear processing (PDF)

R. Redinbo , Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
pp. 299-308

A fast and accurate gate-level transient fault simulation environment (PDF)

H. Cha , Center for Reliable & High-Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 310-319

Wear-out simulation environment for VLSI designs (PDF)

G.S. Choi , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 320-329

Theory and practice of sequential machine testing and testability (PDF)

I. Pomeranz , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 330-337

Programmable space compaction for BIST (PDF)

Y. Zorian , AT&T Bell Lab., Princeton, NJ, USA
pp. 340-349

Balance testing of logic circuits (PDF)

K. Chakrabarty , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 350-359

Impact of behavioral learning on the compilation of sequential circuit tests (PDF)

P. Vishakantaiah , Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
pp. 370-379

An efficient replication protocol exploiting logical tree structures (PDF)

H. Koch , Digital Equipment Corp., Karlsruhe, Germany
pp. 382-391

Specifying fault tolerance within Stark's formalism (PDF)

A. Cau , Inst. fur Inf. unde Praktische Math., Christian-Albrechts-Univ., Kiel, Germany
pp. 392-401

Randomized distributed agreement revisited (PDF)

P. Berman , Dept. of Comput. Sci., Pennsylvania State Univ., University Park, PA, USA
pp. 412-419

Fast, on-line failure recovery in redundant disk arrays (PDF)

M. Holland , Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 422-431

Disk array storage system reliability (PDF)

W.A. Burkhard , Gemini Lab., California Univ., at San Diego, La Jolla, CA, USA
pp. 432-441

A case for fault-tolerant memory for transaction processing (PDF)

A. Bhide , IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 451-460

Efficient distributed diagnosis in the presence of random faults (PDF)

A. Pelc , Quebec Univ., Hull, Que., Canada
pp. 462-469

Distributed on-line diagnosis in the presence of arbitrary faults (PDF)

R.W. Buskens , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 470-479

Adaptive voting for fault (VFF) node scheme for distributed self-diagnosis (PDF)

J.Y. Lee , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
pp. 480-489

Design and synthesis for testability of synchronous sequential circuits based on strong-connectivity (PDF)

I. Pomeranz , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 492-501

Optimal self-recovering microarchitecture synthesis (PDF)

R. Karri , Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
pp. 512-521

TTP - A time-triggered protocol for fault-tolerant real-time systems (PDF)

H. Kopetz , Inst. fur Tech. Inf., Tech. Univ. Wien, Austria
pp. 524-533

Virtually-synchronous communication based on a weak failure suspector (PDF)

A. Schiper , Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA
pp. 534-543

Efficient memory access checking (PDF)

K.D. Wilken , Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
pp. 566-575

The risk of data corruption in microprocessor-based systems (PDF)

R. Horst , Tandem Comput. Inc., Cupertino, CA, USA
pp. 576-585

On concurrent error detection, location, and correction of FFT networks (PDF)

C.G. Oh , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
pp. 596-605

Concurrent error detection/correction in the HAL MMU chip (PDF)

D.C.-W. Chang , HAL Comput. Syst., Campbell, CA, USA
pp. 630-635

Dependability evaluation using UltraSAN (PDF)

W.H. Sanders , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
pp. 674-679

Author index (PDF)

pp. 687
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